Denton Vacuum enables innovation.
Denton Vacuum microscopy and microanalysis tools better enable users to obtain magnified images to study the morphology, structure, and shape of various features, including grains, phases, embedded phases and embedded particles among others features. Denton Vacuum provides micropscopists and microanalysists several, best-in-class tools, from sputter coaters to high vacuum sputter and evaporation tools for tissue and life science sample preparation, to a large sample, high throughout sputter and evaporation tool for these studies.
Denton Vacuum provides investigational tools that allow for greater imaging, visualization, and analysis of nano-scale features and structures, both man-made and natural, including biological structures.
Electron microscopes use a focused beam of electrons (rather than visible light) to illuminate the object being viewed (the sample) to create an image in the examination of biological materials (such as microorganisms and cells), a variety of large molecules, medical biopsy samples, metals and crystalline structures, and the characteristics of various surfaces. Electron microscopes are also used in the fabrication of silicon chips, or within forensics laboratories for looking at samples such as gunshot residues. In fault diagnosis and quality control, for example, electron microscopes can detect stress lines in engine parts or the ratio of air to solids in food stuffs.
Because both the scanning electron microscope (SEM) and transmission electron microscopes (TEM) use vacuum conditions, all non-metal samples must be made conductive by covering the sample with a thin layer of conductive material to prevent charging of the specimen (which occurs because of the accumulation of static electric fields). For SEM, using a sputter coater also increases the amount of secondary electrons that can be detected from the surface, thus increasing the signal-to-noise ratio. Such coatings include gold, gold/palladium, platinum, chromium etc.
Transmission Electron Microscope (TEM)
Scanning Electron Microscope (SEM)
- Asbestos and Materials Microanalysis
- High resolution sample preparation
- Life Sciences
- Material Sciences
- Materials characterization and contaminant analysis
- Nanostructured materials
- Particle sizing and identification
- SEM sample preparation (Carbon Evaporation)
- SEM sample preparation (Sputtering)
- Semiconductor analysis
- Surface measurement and force measurement