

Denton Research: Conformal Superconducting Films on High-Aspect-Ratio TSVs
Posted on
If you read our earlier publication on the scalability problems of quantum device manufacturing, you know why coating the inside of a through-silicon via (TSV) is so difficult. The etching process leaves behind scalloped sidewalls, yet most modern deposition methods are line-of-sight, making the nearly vertical surfaces an immediate challenge. Inside a quantum device, the… Read More








