SIMS Analytics for Semiconductors

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Secondary ion mass spectroscopy (SIMS) is a technique for compositional analysis of solid surfaces (such as semiconductors) in which material is removed from a surface by ion beam sputtering and the resultant positive and negative ions are analyzed in a mass spectrometer. This technique can be used to analyze the composition of semiconductor devices and… Read More

2 Important Factors for Coating in Sample Preparation

Gloved hand holding glass slides with a microscope in the background.

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Thin film coating is an important part of the sample preparation process for microscopy. Samples typically undergo a different preparation process depending on the type of microscope being used for observation, but there are two important factors to consider when coating samples for either type. Scanning Electron Microscopy (SEM) Sample Prep Biological materials, which include… Read More